Two Simple Methods For The Measurement Of The Dielectric Permittivity Of Low-Loss Microstrip Substrates
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Radiation
Link
http://xplorestaging.ieee.org/ielx6/22/25088/01130362.pdf?arnumber=1130362
Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Determination of dielectric properties of unknown substrates using hybrid approach;International Journal of RF and Microwave Computer-Aided Engineering;2020-07-14
2. Measurement of Dielectric Constant of Some Materials Using Planar Technology;2009 Second International Conference on Computer and Electrical Engineering;2009
3. Permittivity characterization from open-end microstrip line measurements;Microwave and Optical Technology Letters;2007
4. A cryogenic post dielectric resonator for precise microwave characterization of planar dielectric materials for superconducting circuits;Superconductor Science and Technology;2004-01-13
5. Electromagnetic properties measurements of ferromagnetic materials using microstrip;MICROW OPT TECHN LET;2002
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