Author:
Kang Xiao-Rui,Ker Ming-Dou
Funder
Ministry of Science and Technology, Taiwan
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. ESD problems in embedded systems;Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2019;2019-11-06
2. Area-Efficient On-Chip Transient Detection Circuit for System-Level ESD Protection Against Transient-Induced Malfunction;IEEE Transactions on Device and Materials Reliability;2019-06