Author:
Zhang Chunwei,Liu Siyang,Xu Kaikai,Wei Jiaxing,Ye Ran,Sun Weifeng,Su Wei,Zhang Aijun,Ma Shulang,Lin Feng,Sun Guipeng
Funder
Hong Kong, Macao and Taiwan Science & Technology Cooperation Program of China
Distinguished Young Scientists Foundation of Jiangsu
China Postdoctoral Science Foundation
Jiangsu Postdoctoral Science Foundation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
4 articles.
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