Automatic test program generation: a case study-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Automatic test program generation: a case study

Published:2004-03 Issue:2 Volume:21 Page:102-109
ISSN:0740-7475
Container-title:IEEE Design & Test of Computers
language:en
Short-container-title:IEEE Des. Test. Comput.

Author:

Corno F.,Sanchez E.,Reorda M.S.,Squillero G.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software,Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx5/54/28573/01277902.pdf?arnumber=1277902

Cited by 66 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Towards an Automatic Test Generation Method for Systems of Systems based on Fault Injection and Model-Based Systems Engineering;Applied Sciences;2022-11-21

2. RemembERR: Leveraging Microprocessor Errata for Design Testing and Validation;2022 55th IEEE/ACM International Symposium on Microarchitecture (MICRO);2022-10

3. High-Level Fault Diagnosis in RISC Processors with Implementation-Independent Functional Test;2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI);2022-07

4. Environment for Innovative University Research Training in the Field of Digital Test;2021 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE);2021-09-01

5. Automated Low-Cost SBST Optimization Techniques for Processor Testing;2021 34th International Conference on VLSI Design and 2021 20th International Conference on Embedded Systems (VLSID);2021-02

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP