Voltage, Throughput, Power, Reliability, and Multicore Scaling-Reference-Cited by-同舟云学术

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Voltage, Throughput, Power, Reliability, and Multicore Scaling

Published:2017 Issue:8 Volume:50 Page:34-45
ISSN:0018-9162
Container-title:Computer
language:
Short-container-title:Computer

Author:

Xia Fei,Rafiev Ashur,Aalsaud Ali,Al-Hayanni Mohammed,Davis James,Levine Joshua,Mokhov Andrey,Romanovsky Alexander,Shafik Rishad,Yakovlev Alex,Yang Sheng

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Computer Science

Link

http://xplorestaging.ieee.org/ielx7/2/7999114/07999145.pdf?arnumber=7999145

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