UVM Based Testbench Architecture for Coverage Driven Functional Verification of SPI Protocol

Author:

Vineeth B.,Tripura Sundari B. Bala

Publisher

IEEE

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Optimal Test Scenarios based Regression Suite for Functional Verification Closure of Advanced Digital Designs;2024 International Conference on Smart Systems for applications in Electrical Sciences (ICSSES);2024-05-03

2. Functional Verification of Multiport SRAM Memories Based on UVM;2023 IEEE East-West Design & Test Symposium (EWDTS);2023-09-22

3. Design and Verification of a High Performance Deserial Serial Peripheral Interface;2023 6th International Conference on Artificial Intelligence and Pattern Recognition (AIPR);2023-09-22

4. Self-Checking and Self-Correctness Testing Design using SPI;2023 8th International Conference on Communication and Electronics Systems (ICCES);2023-06-01

5. Functional Verification of SPI Protocol using UVM based on AMBA Architecture for Flash Memory Applications;2023 4th International Conference on Signal Processing and Communication (ICSPC);2023-03-23

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