Author:
Butnicu Dan,Lazar Luminita-Camelia
Cited by
2 articles.
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1. Reliability and Availability Analysis for Electronic Circuit Design;2023 10th International Conference on Electrical and Electronics Engineering (ICEEE);2023-05-08
2. A Review of Failure Rate Calculation’s Differences Due to Package for IEC-TR-62380 vs. other Prediction Standards;2021 IEEE 27th International Symposium for Design and Technology in Electronic Packaging (SIITME);2021-10-27