Understanding single-turn write head design at narrow track widths-Reference-Cited by-同舟云学术

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Understanding single-turn write head design at narrow track widths

Published:2002-01 Issue:1 Volume:38 Page:124-128
ISSN:0018-9464
Container-title:IEEE Transactions on Magnetics
language:en
Short-container-title:IEEE Trans. Magn.

Author:

Jian-Gang Zhu ,Mao C.Y.,White R.M.,Batra S.,Rottmayer R.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/20/21307/00988923.pdf?arnumber=988923

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Soft Thin Films for Flux Concentrators;IEEE Transactions on Magnetics;2009-01

2. Perpendicular write-head remanence characterization using a contact scanning recording tester;Journal of Applied Physics;2005-05-15

3. Dependence of the pole-tip remanence on the medium magnetization state underneath the trailing shield of a perpendicular write head;Journal of Applied Physics;2005-05-15

4. Micromagnetic modeling of head field rise time for high data-rate recording;IEEE Transactions on Magnetics;2005-02

5. Calculations of magnetization configurations of SPT head using micromagnetic model;Journal of Magnetism and Magnetic Materials;2005-02

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