A Transition Isolation Scan Cell Design for Low Shift and Capture Power
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/6392591/6394156/06394184.pdf?arnumber=6394184
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability;IEEE Transactions on Circuits and Systems II: Express Briefs;2022-02
2. A Statistic-Based Scan Chain Reordering for Energy-Quality Scalable Scan Test;IEEE Journal on Emerging and Selected Topics in Circuits and Systems;2018-09
3. Functional-power-aware Partial Gating Method for Low Power Scan-shift;JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE;2018-02-28
4. An integrated DFT solution for power reduction in scan test applications by low power gating scan cell;Integration;2017-03
5. Physical-aware gating element insertion for thermal-safe scan shift operation;IEICE Electronics Express;2017
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