7.9 1/2.74-inch 32Mpixel-Prototype CMOS Image Sensor with 0.64μ m Unit Pixels Separated by Full-Depth Deep-Trench Isolation-Reference-Cited by-同舟云学术

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7.9 1/2.74-inch 32Mpixel-Prototype CMOS Image Sensor with 0.64μ m Unit Pixels Separated by Full-Depth Deep-Trench Isolation

Published:2021-02-13 Issue: Volume: Page:
ISSN:
Container-title:2021 IEEE International Solid- State Circuits Conference (ISSCC)
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Author:

Park JongEun,Park Sungbong,Cho Kwansik,Lee Taehun,Lee Changkyu,Kim DongHyun,Lee Beomsuk,Kim SungIn,Ji Ho-Chul,Im DongMo,Park Haeyong,Kim Jinyoung,Cha JungHo,Kim Taehoon,Joe In-Sung,Hong Soojin,Chang Chongkwang,Kim Jingyun,Shim WooGwan,Kim Taehee,Lee Jamie,Park Donghyuk,Kim EuiYeol,Park Howoo,Lee Jaekyu,Kim Yitae,Ahn JungChak,Hong YoungKi,Jun ChungSam,Kim HyunChul,Moon Chang-Rok,Kang Ho-Kyu

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9365732/9365735/09365751.pdf?arnumber=9365751

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Inverse design of color routers in CMOS image sensors: toward minimizing interpixel crosstalk;Nanophotonics;2024-07-01

2. Freeform metasurface color router for deep submicron pixel image sensors;Science Advances;2024-05-31

3. Color arrestor pixels for high-fidelity, high-sensitivity imaging sensors;Nanophotonics;2024-04-15

4. Optical design of dispersive metasurface nano-prism structure for high sensitivity CMOS image sensor;2023 International Electron Devices Meeting (IEDM);2023-12-09

5. Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor;Sensors;2023-09-18

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