Comparison of TiₓSi<sub>1-x</sub> O<sub>2</sub> mixed oxide and TiO₂ in SiO₂ nanocomposite dielectric properties at nanoscale-Reference-Cited by-同舟云学术

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Comparison of TiₓSi_1-x O₂ mixed oxide and TiO₂ in SiO₂ nanocomposite dielectric properties at nanoscale

Published:2022-07-03 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE 4th International Conference on Dielectrics (ICD)
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Author:

Villeneuve-Faure C.¹,Mitronika M.²,Boudou L.¹,Ravisy W.²,Besland M.P.²,Richard-Plouet M.²,Goullet A.²

Affiliation:

1. LAPLACE, Université de Toulouse, CNRS, INPT, UPS,Toulouse,France

2. Nantes Université, CNRS, Institut des Matériaux de Nantes Jean Rouxel, IMN,Nantes,France,F-44000

Funder

EDS

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9863422/9863219/09863524.pdf?arnumber=9863524

Reference16 articles.

1. Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy

2. Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy

3. Nanoscale mechanical and electrical characterization of the interphase in polyimide/silicon nitride nanocomposites

4. High dielectric constant oxides

5. Influence of dielectric layer thickness on charge injection, accumulation and transport phenomena in thin silicon oxynitride layers: a nanoscale study

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