Comparison between conventional and nanofilled enamels under different environmental conditions
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx5/57/6231999/06232008.pdf?arnumber=6232008
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Partial Discharge Inception Voltage Monitoring of Enameled Wires under Thermal Stress over Time;Energies;2024-09-12
2. Study of the Partial Discharge Inception Voltage Variation Over Time on Enameled Wires Subjected to Thermal-Electrical Stress;2023 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP);2023-10-15
3. Influence of the stoichiometric ratio on the material properties and the aging behavior of anhydride-cured epoxy systems;Journal of Physics D: Applied Physics;2023-08-07
4. Influence of mixed-frequency medium-voltage and environmental stress on the aging of epoxy;Journal of Physics D: Applied Physics;2023-06-02
5. Dielectric Strength and Patterns of Partial Discharges in Nanocomposites Insulation of Three-Core Belted Power Cables;Transactions on Electrical and Electronic Materials;2021-04-30
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