Author:
Touati A.,Bosio A.,Girard P.,Virazel A.,Bernardi P.,Reorda M. Sonza
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Automatic Test Program Generation for Transition Delay Faults in Pipelined Processors;2021 IEEE International Test Conference in Asia (ITC-Asia);2021-08-18
2. Software-Based Self-Test for Delay Faults;IFIP Advances in Information and Communication Technology;2020
3. Software-Based Self-Test for Transition Faults: a Case Study;2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC);2019-10