Development of Specialized Integrated Circuits for Coordinate X-Ray Detectors-Reference-Cited by-同舟云学术

Development of Specialized Integrated Circuits for Coordinate X-Ray Detectors

Published:2023-11-10 Issue: Volume: Page:
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Container-title:2023 IEEE XVI International Scientific and Technical Conference Actual Problems of Electronic Instrument Engineering (APEIE)
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Author:

Glushak Anastasia A.¹,Aulchenko Vladimir M.²,Shekhtman Lev I.³,Zhulanov Vladimir V.⁴

Affiliation:

1. Novosibirsk State University, Novosibirsk State Technical University, Tomsk State Universiry Novosibirsk,Synchrotron Radiation Facility SKIF,Department of Electrophysical Installations and Accelerators Budker Instutute of Nuclear Physics,Tomsk,Russia

2. Budker Instutute of Nuclear Physics,Department of Elementary Particle Physics,Novosibirsk,Russia

3. Novosibirsk State University, Tomsk State Universiry Novosibirsk,Budker Instutute of Nuclear Physics,Department of Elementary Particle Physics,Tomsk,Russia

4. Budker Instutute of Nuclear Physics, Novosibirsk State University,Department of Physical and Technical Informarics,Novosibirsk,Russia

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10347555/10347542/10347840.pdf?arnumber=10347840

Reference15 articles.

1. Registration of double compression of materials using a synchrotron;Smirnov

2. Study of the effects of surface cracks and texture on residual stresses in tungsten;Balash;Synchrotron and free electron laser radiation: generation and application (SFR-2022),2022

3. Femtosecond time-resolved powder diffraction experiments using hard X-ray free-electron lasers

4. Radiation hardness of GaAs:Cr and Si sensors irradiated by 21 MeV electron beam

5. Space charge formation in chromium compensated GaAs radiation detectors

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1. Control Electronics for One-Coordinate X-Ray Detectors;2024 IEEE 25th International Conference of Young Professionals in Electron Devices and Materials (EDM);2024-06-28

2. Specialized Integrated Circuit for Coordinate Counting Detectors;Optoelectronics, Instrumentation and Data Processing;2024-02