An Unsupervised Bayesian OC-SVM Approach for Early Degradation Detection, Thresholding and Fault Prediction in Machinery Monitoring
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx7/19/4407674/09662054.pdf?arnumber=9662054
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