Author:
Rochwerger Benny,Breitgand David,Epstein Amir,Hadas David,Loy Irit,Nagin Kenneth,Tordsson Johan,Ragusa Carmelo,Villari Massimo,Clayman Stuart,Levy Eliezer,Maraschini Alessandro,Massonet Philippe,Mu Henar,Tofetti Giovanni
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
136 articles.
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