Pathological Element-Based Active Device Models and Their Application to Symbolic Analysis-Reference-Cited by-同舟云学术

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Pathological Element-Based Active Device Models and Their Application to Symbolic Analysis

Published:2011-06 Issue:6 Volume:58 Page:1382-1395
ISSN:1549-8328
Container-title:IEEE Transactions on Circuits and Systems I: Regular Papers
language:
Short-container-title:IEEE Trans. Circuits Syst. I

Author:

Sanchez-Lopez Carlos,Fernandez Francisco V.,Tlelo-Cuautle Esteban,Tan Sheldon X.-D.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/8919/5773659/05685596.pdf?arnumber=5685596

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