Nano-Intrinsic True Random Number Generation: A Device to Data Study

Author:

Kim JeesonORCID,Nili Hussein,Truong Nhan DuyORCID,Ahmed TaimurORCID,Yang Jiawei,Jeong Doo SeokORCID,Sriram SharathORCID,Ranasinghe Damith C.,Ippolito Samuel,Chun Hosung,Kavehei OmidORCID

Funder

Australian Research Council

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Cited by 23 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Ferroelectric Stochasticity in 2D CuInP2S6 and Its Application for True Random Number Generator;Advanced Materials;2024-07-16

2. Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators;IEEE Transactions on Device and Materials Reliability;2024-06

3. True Random Number Generator Based on RRAM-Bias Current Starved Ring Oscillator;IEEE Journal on Exploratory Solid-State Computational Devices and Circuits;2023-12

4. Reliability Analysis of Random Telegraph Noisebased True Random Number Generators;2023 IEEE International Integrated Reliability Workshop (IIRW);2023-10-08

5. Optimizing free layer of Magnetic Tunnel Junction for true random number generator;Memories - Materials, Devices, Circuits and Systems;2023-10

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