A Novel Framework to Estimate the Path Delay Variability On the Back of an Envelope via the Fan-Out-of-4 Metric

Author:

Alioto Massimo,Scotti GiuseppeORCID,Trifiletti Alessandro

Funder

Ministry of Education - Singapore

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Cited by 24 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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4. Path-Based Delay Variation Models for Parallel-Prefix Adders;IEEE Transactions on Emerging Topics in Computing;2023-07-01

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