Experimental Study on Transition Loss of On-Chip SIW Interconnects and Transmission Lines Using Two De-Embedding Reference Planes in 200 GHz Band Frequency
Author:
Affiliation:
1. Graduate School of Information Science and Electrical Engineering, Kyushu University,Japan
2. Hiroshima University,Japan
3. National Institute of Information and Communication Technology,Japan
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx8/10600173/10600174/10600291.pdf?arnumber=10600291
Reference18 articles.
1. Substrate Integrated Transmission Lines: Review and Applications
2. Substrate-Integrated Nonradiative Dielectric (SINRD) Waveguide for THz Integrated Circuits and Systems
3. Millimeter-Wave High Q-factor Sixteenth Mode SIW Cavity Resonator Implemented in 0.18-µm CMOS Technology
4. Implementation of SIW Cavity in Commercial CMOS Technology for Sub-Terahertz Band Applications
5. Implementation of Low-Loss Sub-Terahertz Band Substrate Integrated Waveguide-based Interconnects and Cavities in CMOS Technology
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