Experimental Demonstration of the Small Pixel Effect in an Amorphous Photoconductor using a Monolithic Spectral Single Photon Counting Capable CMOS-Integrated Amorphous-Selenium Sensor
Author:
Affiliation:
1. University of Waterloo,Department of Electrical and Computer Engineering,Waterloo,Ontario,Canada
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10019319/10019320/10019531.pdf?arnumber=10019531
Reference6 articles.
1. The effects of intra-detector Compton scatter on zero-frequency DQE for photon-counting CT using edge-on-irradiated silicon detectors;grönberg;arXiv preprint arXiv 2206 04164,2022
2. Charge Transport in Arrays of Semiconductor Gamma-Ray Detectors
3. A Monolithic Amorphous-Selenium/CMOS Single-Photon-Counting X-Ray Detector
4. High dose efficiency, ultra-high resolution amorphous selenium/CMOS hybrid digital X-ray imager
5. Signals induced in semiconductor gamma-ray imaging detectors
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