Author:
Ercolani S.,Favalli M.,Damiani M.,Olivo P.,Ricco B.
Cited by
65 articles.
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1. A Framework for Reliability Analysis of Combinational Circuits Using Approximate Bayesian Inference;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-04
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3. Efficient Analysis for Mitigation of Workload-Dependent Aging Degradation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-12
4. Accurate Reliability Boundary Evaluation of Approximate Arithmetic Circuit;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-10
5. Accurate reliability analysis methods for approximate computing circuits;Tsinghua Science and Technology;2022-08