Author:
Kalma A. H.,Berger R. A.,Fischer C. J.,Green B. A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
13 articles.
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1. Statistical spread on the displacement damage degradation of irradiated semiconductors;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2021-03
2. Displacement Damage Effects in InGaAs Photodiodes due to Electron, Proton, and Neutron Irradiations;IEEE Transactions on Nuclear Science;2020-07
3. Experimental Study of the NIEL Scaling for Silicon Devices;2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2018-09
4. About the scatter of displacement damage and its consequence on the NIEL scaling approach;2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2018-09
5. Gamma and Electron NIEL Dependence of Irradiated GaAs;IEEE Transactions on Nuclear Science;2017-03