Author:
Heijne H. M.,Belcarz E.,Muller J. C.,Siffert P.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
4 articles.
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2. Scanning ion deep level transient spectroscopy: II. Ion irradiated Au–Si Schottky junctions;Journal of Physics D: Applied Physics;2006-03-17
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