Workbench Study of Loading Consequences on Reliability of DC-DC PoL Converters Based on Discrete Transistors-Reference-Cited by-同舟云学术

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Workbench Study of Loading Consequences on Reliability of DC-DC PoL Converters Based on Discrete Transistors

Published:2022-10-26 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE 28th International Symposium for Design and Technology in Electronic Packaging (SIITME)
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Author:

Butnicu Dan¹

Affiliation:

1. Technical University “Ghe. Asachi” of Iasi,Electronics, Telecommunications and Information Technology Faculty,Iasi,Romania

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9987716/9987742/09987935.pdf?arnumber=9987935

Reference9 articles.

1. Predicting the reliability of electronic equipment

2. Reliability Calculation Method for Output Capacitor Bank used in Telecom Power Supplies

3. Mission Profile Based System-Level Reliability Analysis of DC/DC Converters for a Backup Power Application

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. IR-Scanning vs. PSIM-Thermal Simulation concerning π_T Stress Factor used in DC-DC Converter’s Reliability Calculation.;2023 IEEE 29th International Symposium for Design and Technology in Electronic Packaging (SIITME);2023-10-18

2. A Study of Switching Frequency Impact on Reliability of DC-DC PoL Converters With Discrete Transistors;IEEE Transactions on Industry Applications;2023-09

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