Author:
Habas P.,Groeseneken G.,Van den Bosch G.
Cited by
4 articles.
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1. Open volume defect accumulation with irradiation in GaN, GaP, InAs, InP, Si, ZnO, and MgO;Journal of Applied Physics;2023-12-08
2. Application of Charge Pumping Technique for MOSFET Devices Reliability;2023 IEEE 33rd International Conference on Microelectronics (MIEL);2023-10-16
3. An evaluation of MOS interface-trap charge pump as an ultralow constant-current generator;IEEE Journal of Solid-State Circuits;2003-01
4. Basics and applications of charge pumping in submicron MOSFETs© 1997 IEEE. Reprinted, with permission, from Proc. 1997 21st International Conference on Microelectronics, Nis, Yugoslavia, 14–17 September 1997, Vol. 2, pp. 581–589.;Microelectronics Reliability;1998-09