On the Correlation Between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level

On the Correlation Between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part I

Author:

Boyer Alexandre¹^ORCID,Nolhier Nicolas¹^ORCID,Caignet Fabrice¹^ORCID,Dhia Sonia Ben¹

Affiliation:

1. Laboratory of Analysis and Architecture of Systems, French National Institute of Applied Sciences, University of Toulouse, Toulouse, France

Funder

French National Centre for Space Studies

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Link

Reference25 articles.

2. Local probe injection compared to direct ESD injection;xiao;Proc 7th Int Workshop Electromagn Compat Integr Circuits–Toulouse,2009

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1. A Prescan Method to Accelerate Near-Field Scan Immunity Tests;IEEE Letters on Electromagnetic Compatibility Practice and Applications;2024-06

2. Correlation Between Conducted Injection and Near-Field Scan Immunity in the L-Band;2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa);2024-05-20