Scalar Matching Indexes for Broadband EM Noise Source Determination With One-Port Measurements
Author:
Affiliation:
1. Electronic Systems Research Department, Hitachi, Ltd., R&D Group, CTI – Production Engineering, Yokohama, Japan
Funder
Hitachi, Ltd
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics
Link
http://xplorestaging.ieee.org/ielx7/15/9795197/09703191.pdf?arnumber=9703191
Reference22 articles.
1. Scanning of random fields using blind source separation
2. Improving time-domain EMI measurements through digital signal processing
3. Decomposition of Electromagnetic Interferences in the Time-Domain
4. A Method for Finding Frequency-Modulated and Amplitude-Modulated Electromagnetic Emanations in Computer Systems
5. Classification of Electronic Devices and Software Processes via Unintentional Electronic Emissions With Neural Decoding Algorithms
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