Failure Scenario of Power Supply Due to Conducted Electric Pulse From E1 HEMP
Author:
Affiliation:
1. CEA DAM, Gramat, France
2. CNRS, IMS UMR 5218, University of Bordeaux, Talence, France
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics
Link
http://xplorestaging.ieee.org/ielx7/15/10105548/09985453.pdf?arnumber=9985453
Reference21 articles.
1. Electromagnetic Compatibility (EMC) - Part 2: Environment – Section 9: Description of HEMP Environment - Radiated Disturbance,1996
2. Destruction analyses of power supplies due to electric pulse
3. Surge immunity test of personal computer at power lines
4. Modeling of a Current Injection System for Susceptibility Study
5. A study on self turn-on phenomenon in fast switching operation of high voltage power MOSFET
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2. Methodology for Extracting Low-Frequency Input Impedance of Personal Computer During Operation Using Dual Current Probes Method;IEEE Transactions on Electromagnetic Compatibility;2024-04
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