A New Method Exploiting Partial Image Expansion to Include Substrate and Ground in Dipole-Based Near-Field Models
Author:
Affiliation:
1. Department of Electronics, Information and Bioengineering, Politecnico di Milano, Milano, Italy
2. Power Systems, EMC and Space Environment Division, European Space Technology Center, European Space Agency, Noordwijk, The Netherlands
Funder
European Space Agency
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics
Link
http://xplorestaging.ieee.org/ielx7/15/10359425/10297988.pdf?arnumber=10297988
Reference29 articles.
1. Near-field scanning and its EMC applications
2. Investigation of Semi-Rigid Coaxial Test Probes as RF Injection Devices for Immunity Tests at PCB Level
3. Applications of the Near-Field Techniques in EMC Investigations
4. Test Design Methodology for Time-Domain Immunity Investigations Using Electric Near-Field Probes
5. Theory and Applications of Infinitesimal Dipole Models for Computational Electromagnetics
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1. Partial Image Expansion Applied to Real Near-Field Measurement Data Modeling;2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa);2024-05-20
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