Modeling and Analysis of Signal Integrity of High-Frequency Transmission Channel With Degraded Fuzz Button Connectors-Reference-Cited by-同舟云学术

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Modeling and Analysis of Signal Integrity of High-Frequency Transmission Channel With Degraded Fuzz Button Connectors

Published:2024 Issue: Volume: Page:1-12
ISSN:0018-9375
Container-title:IEEE Transactions on Electromagnetic Compatibility
language:
Short-container-title:IEEE Trans. Electromagn. Compat.

Author:

Wang Wenjia¹,Gao Jinchun¹^ORCID,Wang Ziren²^ORCID,Zhang Tianmeng¹,Wang Chaoyi¹^ORCID,Bilal Hafiz Muhammad¹^ORCID

Affiliation:

1. Beijing Key Laboratory of Work Safety Intelligent Monitoring, Beijing University of Posts and Telecommunications, Beijing, China

2. China Telecommunication Technology Labs, China Academy of Information and Communications Technology, Beijing, China

Funder

National Key R&D Program of China

Beijing University of Posts and Telecommunications

China Scholarship Council

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/15/4358749/10596977.pdf?arnumber=10596977

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