A Proposed On-Die Oscilloscope for Monitoring of Power Noise Waveform Inside IC Due to Transient Stress Events
Author:
Affiliation:
1. Department of Electrical Engineering, Ulsan National Institute of Science and Technology, Ulsan, South Korea
2. Global Technology Center, Samsung Electronics, Suwon, South Korea
Funder
Agency for Defense Development
Republic of Korea
National Research Foundation of Korea
Institute of Information and Communications Technology Planning and Evaluation
IC Design Education Center
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics
Link
http://xplorestaging.ieee.org/ielx7/15/9757048/09669922.pdf?arnumber=9669922
Reference22 articles.
1. On-Chip monitors of supply noise generated by system-level ESD
2. A high performance peak detector sample and hold circuit for detecting power supply noise
3. On-Chip Transient Detection Circuit for System-Level ESD Protection in CMOS Integrated Circuits to Meet Electromagnetic Compatibility Regulation
4. Transient-to-Digital Converter for System-Level Electrostatic Discharge Protection in CMOS ICs
5. Voltage monitor circuit for ESD diagnosis;jack;Proc Electrical Overstress/Electrostatic Discharge Symp,2011
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