Near-Field Scan of Multiple Noncorrelated Sources Using Blind Source Separation

Author:

Liu YuanzhuoORCID,Li JiangshuaiORCID,Hwang ChulsoonORCID,Khilkevich VictorORCID

Funder

National Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Single-Channel Blind Source Separation for Periodic Electromagnetic Switching Noise;IEEE Transactions on Electromagnetic Compatibility;2023-10

2. Near Field Scanning-Based EMI Radiation Root Cause Analysis in an SSD;2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI);2023-07-29

3. A Real-time Microwave Camera Prototype with Zero-bias Diode Detectors for EMI Source Imaging;2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI);2023-07-29

4. The opening workspace control strategy of a novel manipulator-driven emission source microscopy system;ISA Transactions;2023-03

5. Spectro-Temporal Self-Similarity Based Identification of Corrupted Acoustic Signal of Distribution Transformer in Noisy Environment;IEEE Transactions on Power Delivery;2023-02

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