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Single-Probe Inductively Coupled In-Circuit Impedance Measurement

  • Published:2021 Issue: Volume: Page:1-9
  • ISSN:0018-9375
  • Container-title:IEEE Transactions on Electromagnetic Compatibility
  • language:
  • Short-container-title:IEEE Trans. Electromagn. Compat.

Author:

Weerasinghe Arjuna,Zhao Zhenyu,Narampanawe Nishshanka,Yang Zhenning,Svimonishvili Tengiz,See Kye Yak

Funder

SMRT-NTU Smart Urban Rail Corporate Laboratory

National Research Foundation Singapore

SMRT

Nanyang Technological University

Corp LabUniversity Scheme

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Inductively Coupled in-Circuit Measurement of Two-Port Admittance Parameters;IEEE Transactions on Industrial Electronics;2024-10

2. Accuracy Assessment of Non-Intrusive Measurement of Two-Port Impedance and Admittance Parameters by Inductive Couplers;2024 IEEE International Symposium on Measurements & Networking (M&N);2024-07-02

3. Methodology for Extracting Low-Frequency Input Impedance of Personal Computer During Operation Using Dual Current Probes Method;IEEE Transactions on Electromagnetic Compatibility;2024-04

4. Improving the single current probe method of in-circuit impedance measurement;AIP Conference Proceedings;2024

5. Bypass Capacitor Design for Wideband Impedance Measurements of Inductive Coupling Approaches;2023 2nd International Conference on Sensing, Measurement, Communication and Internet of Things Technologies (SMC-IoT);2023-12-29
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