Microelectronics Failure Prediction and Localization from Optical and Thermal Imagery
Author:
Affiliation:
1. Drake University,Dept. of Mathematics and Computer Science,Des Moines,Iowa
2. Indiana University,Dept. of Computer Science,Bloomington,Indiana
3. Purdue University,Dept. of Electrical Engineering,West Lafayette,Indiana
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9707693/9707694/09707706.pdf?arnumber=9707706
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4. Lung cancer tumor region segmentation using recurrent 3d-denseunet;kamal,2018
5. Aggregated sparse attention for steering angle prediction;sen;Proceedings of the International Conference on Pattern Recognition (ICPR),2018
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