Author:
Tseng-Chin Luo ,Chao Mango C.-T,Fisher P. A.,Chun-Ren Kuo
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
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1. Fracture time predictor in mask data preparation using machine learning;Photomask Technology 2018;2018-10-03
2. Density-Uniformity-Aware Analog Layout Retargeting;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2018-10