Testing DSP cores based on self-test programs
Author:
Publisher
IEEE Comput. Soc
Link
http://xplorestaging.ieee.org/ielx4/5270/14300/00655852.pdf?arnumber=655852
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Efficient Software-Based Self-Test Methods for Embedded Digital Signal Processors;2009 Asian Test Symposium;2009
2. Employing user profiles to test a new version of a GUI component in its context of use;Software Quality Journal;2006-12
3. A Self Test Program Design Technique for Embedded DSP Cores;Journal of Electronic Testing;2006-02
4. Low-cost, on-line self-testing of processor cores based on embedded software routines☆;Microelectronics Journal;2004-05
5. A Low-Cost At-Speed BIST Architecture for Embedded Processor and SRAM Cores;Journal of Electronic Testing;2004-04
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