Machine Learning, Markov Chain Monte Carlo, and Optimal Algorithms to Characterize the AdvACT Kilopixel Transition-Edge Sensor Arrays
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Published:2019-08
Issue:5
Volume:29
Page:1-5
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ISSN:1051-8223
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Container-title:IEEE Transactions on Applied Superconductivity
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language:
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Short-container-title:IEEE Trans. Appl. Supercond.
Author:
Salatino MariaORCID,
Hubmayr Johannes,
Li Yaqiong,
Niemack Michael D.,
Simon Sara M.,
Staggs Suzanne T.,
Wollack Edward J.ORCID,
Austermann Jason,
Beall James A.,
Choi Steve,
Crowley Kevin T.,
Duff ShannonORCID,
Henderson Shawn W.,
Hilton Gene,
Ho S.-P. P.
Funder
National Science Foundation
National Aeronautics and Space Administration
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials