A Tear-Drop Bifilar Sample Holder for Full Excitation and Stability Studies of HTS Cables at 4.2 K Using a Superconducting Transformer
-
Published:2019-08
Issue:5
Volume:29
Page:1-5
-
ISSN:1051-8223
-
Container-title:IEEE Transactions on Applied Superconductivity
-
language:
-
Short-container-title:IEEE Trans. Appl. Supercond.
Author:
Kovacs Chris J.ORCID,
Sumption Mike D.ORCID,
Barzi EmanuelaORCID,
Zlobin Alexander V.ORCID,
Majoros MilanORCID
Funder
U.S. Department of Energy
Office of High Energy Physics
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials