Synchrotron Microtomography Investigation of the Filament Microstructure in Differently Processed Bi-2212 Wires-Reference-Cited by-同舟云学术

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Synchrotron Microtomography Investigation of the Filament Microstructure in Differently Processed Bi-2212 Wires

Published:2017-06 Issue:4 Volume:27 Page:1-5
ISSN:1051-8223
Container-title:IEEE Transactions on Applied Superconductivity
language:
Short-container-title:IEEE Trans. Appl. Supercond.

Author:

Scheuerlein Christian¹,Rack Alexander²,Schladitz Katja³,Huwig Luisa⁴

Affiliation:

1. European Organization for Nuclear Research, Geneva, Switzerland

2. European Synchrotron Radiation Facility, Grenoble, France

3. Fraunhofer Institute for Industrial Mathematics, Kaiserslautern, Germany

4. Department of Mathematics, Universität des Saarlandes, Saarbrücken, Germany

Funder

EuCARD-2

European Commission

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/77/7753032/07795246.pdf?arnumber=7795246

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Variation of effective filament diameter, irreversibility field, anisotropy, and pinning efficiency in Bi-2212 round wires;Superconductor Science and Technology;2023-12-20

2. ac susceptibility studies of intra- and intergrain properties of high- Jc Bi-2212 wires;Physical Review Materials;2023-01-09

3. Microstructure and Critical Current Density of Bi-2212 Single- and Multi-filamentary Wires with Overpressure Heat Treatment Processing;Journal of Superconductivity and Novel Magnetism;2022-09-06

4. Machine learning applied to X-ray tomography as a new tool to analyze the voids in RRP Nb3Sn wires;Scientific Reports;2021-04-08

5. Boosting spatial resolution by incorporating periodic boundary conditions into single-distance hard-x-ray phase retrieval;Journal of Optics;2020-10-13

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