ON-state retention of Atom Switch eNVM for IoT/AI Inference Solution-Reference-Cited by-同舟云学术

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ON-state retention of Atom Switch eNVM for IoT/AI Inference Solution

Published:2020-04 Issue: Volume: Page:
ISSN:
Container-title:2020 IEEE International Reliability Physics Symposium (IRPS)
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Author:

Okamoto Koichiro,Nebashi Ryusuke,Banno Naoki,Bai Xu,Numata Hideaki,Iguchi Noriyuki,Miyamura Makoto,Hada Hiromitsu,Funahashi Kazunori,Sugibayashi Tadahiko,Sakamoto Toshitsugu,Tada Munehiro

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9125439/9128217/09128967.pdf?arnumber=9128967

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. NanoBridge Technology for Embedded Novolatile Memory Application;2022 IEEE International Memory Workshop (IMW);2022-05

2. Neuromorphic display system for intelligent display;Nano Energy;2022-04

3. NanoBridge Technology for Novoaltile FPGA and Memory Applications : (Invited);2022 IEEE International Reliability Physics Symposium (IRPS);2022-03

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