Author:
Yu Kuilong,Zhu Xiaojuan,Fang Rui,Ma Tingting,Han Kun,Xia Zhongyi
Cited by
2 articles.
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1. Polarity Dependency and 1/E Model of Gate Oxide TDDB Degradation in 3D NAND;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03
2. Anomalous NMOSFET hot carrier degradation on DRAM;2021 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA);2021-11-24