Comparative Analysis of Fault-Localization Techniques in Adder
Author:
Affiliation:
1. Hamad Bin Khalifa University,Division of Information and Computing Technology, College of Sci. and Engineering,Doha,Qatar
2. Chosun University,Computer System Lab,Department of Computer Engineering,Gawangju,Korea
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx8/10592105/10592309/10592502.pdf?arnumber=10592502
Reference15 articles.
1. Analyzing fault effects in the 32-bit OpenRISC 1200 microprocessor
2. Argus: Low-Cost, Comprehensive Error Detection in Simple Cores
3. An island-style-routing compatible fault-tolerant FPGA architecture with self-repairing capabilities
4. Basic mechanisms and modeling of single-event upset in digital microelectronics
5. A Theory of Totally Self-Checking System Design
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