Dual-regulator dual-decoding-trimmer DRAM voltage limiter for burn-in test-Reference-Cited by-同舟云学术

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Dual-regulator dual-decoding-trimmer DRAM voltage limiter for burn-in test

Published:1991 Issue:11 Volume:26 Page:1544-1549
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Horiguchi M.,Aoki M.,Etoh J.,Itoh K.,Kajigaya K.,Nozoe A.,Matsumoto T.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx1/4/3123/00098970.pdf?arnumber=98970

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Low-Power Microcontroller Having a 0.5-<tex>$muhboxA$</tex>Standby Current On-Chip Regulator With Dual-Reference Scheme;IEEE Journal of Solid-State Circuits;2004-04

2. Energy-aware design of embedded memories;ACM Transactions on Embedded Computing Systems;2003-02

3. Parameter optimization of an on-chip voltage reference circuit using evolutionary programming;IEEE Transactions on Evolutionary Computation;2001

4. Low-Power Memory Circuits;VLSI Memory Chip Design;2001

5. On-Chip Voltage Generators;VLSI Memory Chip Design;2001

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