Author:
Al-Ars Z.,Herzog M.,Schanstra I.,van de Goor A.J.
Cited by
3 articles.
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1. Detecting and mitigating data-dependent DRAM failures by exploiting current memory content;Proceedings of the 50th Annual IEEE/ACM International Symposium on Microarchitecture;2017-10-14
2. Mitigating bitline crosstalk noise in DRAM memories;Proceedings of the International Symposium on Memory Systems;2017-10-02
3. Influence of Bit-Line Coupling and Twisting on the Faulty Behavior of DRAMs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2006-12