Deep Learning Based Workflow for Accelerated Industrial X-Ray Computed Tomography

Author:

Rahman Obaidullah1,Venkatakrishnan Singanallur V.1,Scime Luke1,Brackman Paul2,Frederick Curtis2,Dehoff Ryan1,Paquit Vincent1,Ziabari Amirkoushyar1

Affiliation:

1. Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830

2. Carl Zeiss Industrial Metrology, LLC,Maple Grove,MN,USA,55369

Funder

UT-Battelle

Office of Energy

Advanced Manufacturing Office

Publisher

IEEE

Reference16 articles.

1. A Threshold Selection Method from Gray-Level Histograms

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4. U-net: Convolutional networks for biomedical image segmentation;ronneberger;International Conference on Medical Image Computing and Computer-Assisted Intervention,2015

5. Neural Network-based Single-material Beam Hardening Correction for X-ray CT in Additive Manufacturing;rahman;(to appear) 17th International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine,2023

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