Deep Learning Based Workflow for Accelerated Industrial X-Ray Computed Tomography
Author:
Affiliation:
1. Oak Ridge National Lab (ORNL),Oak Ridge,TN,37830
2. Carl Zeiss Industrial Metrology, LLC,Maple Grove,MN,USA,55369
Funder
UT-Battelle
Office of Energy
Advanced Manufacturing Office
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10221937/10221892/10223192.pdf?arnumber=10223192
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