Differential Enhanced Siamese Segmentation Network for Printed Label Defect Detection
Author:
Affiliation:
1. Harbin Institute of Technology,School of Computer Science and Technology,Shenzhen,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10221937/10221892/10222759.pdf?arnumber=10222759
Reference21 articles.
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1. A two-stage defect detection method for unevenly illuminated self-adhesive printed materials;Scientific Reports;2024-09-04
2. DA-UNet: An improved UNet-based algorithm for segmenting defects in printed cards;2024 IEEE 6th Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC);2024-05-24
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