Study of the Effects of Edge Morphology on Detector Performance by Leakage Current and Cathodoluminescence

Author:

Crocco J.,Bensalah H.,Zheng Q.,Dierre F.,Hidalgo P.,Carrascal J.,Vela O.,Piqueras J.,Dieguez E.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

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