Closed-Loop Compensation of Charge Trapping Induced by Ionizing Radiation in MOS Capacitors
Author:
Funder
Spanish projects
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Control and Systems Engineering
Link
http://xplorestaging.ieee.org/ielx7/41/8214929/08023818.pdf?arnumber=8023818
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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2. Facile synthesis of H-CoMoO4 nanosheets for antibacterial approaches;Chemical Papers;2021-10-18
3. Radiation response of zirconium silicate P-MOS capacitor;Microelectronics Reliability;2020-06
4. Radiation tolerance, charge trapping, and defect dynamics studies of ALD-grown Al/HfO2/Si nMOSCAPs;Journal of Materials Science: Materials in Electronics;2020-01-16
5. Diffusive Representation and Sliding Mode Control of Charge Trapping in Al$_2$O$_3$ MOS Capacitors;IEEE Transactions on Industrial Electronics;2019-11
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