Author:
Liu Yingdi,Rajski Janusz,Reddy Sudhakar M.,Solecki Jedrzej,Tyszer Jerzy
Cited by
6 articles.
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1. Test Compaction Using (k, 1)-Cycle Tests;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
2. Functional Compaction for Functional Test Sequences;IEEE Access;2024
3. Storage-Based Logic Built-In Self-Test With Cyclic Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-09
4. Test Data Compression for Transparent-Scan Sequences;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-04
5. Diagnostic Test Point Insertion and Test Compaction;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-02